@article { author = {Y. Illarionov, A. Smith, S. Vaziri, M. Ostling, T. Mueller, M. Lemme, and T. Grasser}, title = {Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences}, journal = {Electron Devices IEEE Trans.}, year = {2015}, volume = {62}, pages = {3876-3881}, issue = {11}, url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7302128}, doi = {http://dx.doi.org/10.1109/TED.2015.2480704}, }